G06000 - SEMI G60 - 半導体リードフレーム挿間紙材料の静電特性の測定方法 Revision:SEMI G60-94 (Reapproved 0811) - Superseded for use on silicon specimens

Name: G06000 - SEMI G60 - 半導体リードフレーム挿間紙材料の静電特性の測定方法 Revision:SEMI G60-94 (Reapproved 0811) - Superseded for use on silicon specimens
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Description

for use on silicon specimens only

The diameter and thickness range covered by this Test Method depends on details of the specific set-up used

such as sapphire

as a measure of the effectiveness of passivation processes

SEMI E15-0698 (technical revision)

G06000 - SEMI G60 - 半導体リードフレーム挿間紙材料の静電特性の測定方法 Revision:SEMI G60-94 (Reapproved 0811) - Superseded for use on silicon specimensglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org199420023 : Referenced SEMI Standards None.

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